On July 1st, Toshiba Corporation's Semiconductor Company and Storage Products Company consolidated to form Semiconductor & Storage Products Company.This page describes reliability information of semiconductor products.

Statistical Process Control

[As of April, 2011]

Toshiba applies statistical methods in each process based on the idea that quality is not achieved through inspection, but rather built into the manufacturing process. Variations that affect quality are quantitatively identified and analyzed so as to improve quality.
Critical control items are first defined based on factors that affect quality and reliability, factors that have caused major problems in the past, and factors correlated with defect mechanisms, as shown in Figure 1. The process capability of each process is then surveyed based on these items, and process improvements and continuous quality improvement activities are implemented for those processes with a poor process capability index. A computer integrated manufacturing (CIM) system is employed to improve data entry efficiency and enhance Statistical Process Control ( SPC ) effectiveness.
Furthermore, educational curricula are incorporated in training to promote the use of statistical methods among operators and engineers, so as to broaden the use of SPC and further improve quality.

This is [Figure 1 Quality Improvement Activity Flow].

Figure 1 Quality Improvement Activity Flow