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Describes the basic concept of semiconductor device reliability and what affects it. |
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Describes various circuit faults that can occur in semiconductor devices, and their mechanisms from both device and assembly perspectives. |
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Discusses reliability testing, which is essential to assure high reliability. |
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Describes part stress analysis prediction, a technique used to predict possible failure rates of semiconductor devices. |
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Describes equipment and procedures for failure analysis and introduces an example of a commonly used technique
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