On July 1st, Toshiba Corporation's Semiconductor Company and Storage Products Company consolidated to form Semiconductor & Storage Products Company.This page describes reliability information of semiconductor products.
ASIC Product Failure Location Identification Using EB Tester Image
[As of April, 2011]
- Purpose
To identify voltage margin failure in ASIC product test process, using EB tester. - Analysis and Result
Figure 1 shows photographs of image-based failure location identification for an ASIC product with a defective voltage margin. The images allow the viewer to observe the path of failure propagation based on the black or white contrast within the image, and identify the failure location by tracing the contrast on the screen. In this example, tracing was performed starting from image (a), with the failure location identified as the location of image (e).
![This is [Figure 1 Example of Analysis by Image Comparison].](/eng/product/reliability/device/analysis/analysis4/__icsFiles/artimage/2009/10/28/ec_relia5_54/E_04-014_z04-01_450.jpg "This is [Figure 1 Example of Analysis by Image Comparison].")
Figure 1 Example of Analysis by Image Comparison
On July 1st, Toshiba Corporation's Semiconductor Company and Storage Products Company consolidated to form Semiconductor & Storage Products Company.This page describes reliability information of semiconductor products.